鋼管(guan)漏(lou)磁(ci)檢測系(xi)統中，常(chang)(chang)常(chang)(chang)需要(yao)進行人機(ji)交互(hu)(hu)，如(ru)向系(xi)統發(fa)出一些控制(zhi)指令，設置系(xi)統的(de)(de)(de)某些參數等(deng)等(deng)，而(er)鍵(jian)(jian)(jian)(jian)(jian)盤(pan)(pan)是主要(yao)的(de)(de)(de)人機(ji)交互(hu)(hu)平臺(tai)。目前實(shi)(shi)現鍵(jian)(jian)(jian)(jian)(jian)盤(pan)(pan)的(de)(de)(de)主要(yao)有(you)兩(liang)(liang)種(zhong)(zhong)方案(an)：一種(zhong)(zhong)是采用(yong)專門的(de)(de)(de)鍵(jian)(jian)(jian)(jian)(jian)盤(pan)(pan)接(jie)口(kou)芯(xin)片，如(ru)Intel 8279芯(xin)片；另一種(zhong)(zhong)是利(li)用(yong)單(dan)片機(ji)軟(ruan)件實(shi)(shi)現的(de)(de)(de)鍵(jian)(jian)(jian)(jian)(jian)盤(pan)(pan)掃描。由(you)于C8051F020功能較強，因(yin)此(ci)，為(wei)了減小系(xi)統的(de)(de)(de)成本(ben)及(ji)電路的(de)(de)(de)復雜(za)程(cheng)度，飛泰漏(lou)磁(ci)檢測系(xi)統采用(yong)第二種(zhong)(zhong)方案(an)。此(ci)外，軟(ruan)件實(shi)(shi)現的(de)(de)(de)按(an)(an)(an)鍵(jian)(jian)(jian)(jian)(jian)掃描鍵(jian)(jian)(jian)(jian)(jian)盤(pan)(pan)按(an)(an)(an)照設計結構分(fen)又可(ke)以分(fen)為(wei)獨(du)立按(an)(an)(an)鍵(jian)(jian)(jian)(jian)(jian)式(shi)鍵(jian)(jian)(jian)(jian)(jian)盤(pan)(pan)和矩陣式(shi)鍵(jian)(jian)(jian)(jian)(jian)盤(pan)(pan)兩(liang)(liang)種(zhong)(zhong)。所(suo)(suo)謂獨(du)立按(an)(an)(an)鍵(jian)(jian)(jian)(jian)(jian)式(shi)鍵(jian)(jian)(jian)(jian)(jian)盤(pan)(pan)即(ji)一個按(an)(an)(an)鍵(jian)(jian)(jian)(jian)(jian)連(lian)接(jie)單(dan)片機(ji)的(de)(de)(de)一個I/O口(kou)，其優點是各(ge)按(an)(an)(an)鍵(jian)(jian)(jian)(jian)(jian)之間相互(hu)(hu)獨(du)立、程(cheng)序編程(cheng)容易、按(an)(an)(an)鍵(jian)(jian)(jian)(jian)(jian)識(shi)別簡(jian)單(dan)；缺點是占用(yong)I/O口(kou)數量(liang)太多(duo)，使(shi)其不能大量(liang)運用(yong)。所(suo)(suo)謂矩陣式(shi)鍵(jian)(jian)(jian)(jian)(jian)盤(pan)(pan)是在單(dan)片機(ji)I/O口(kou)的(de)(de)(de)線(xian)分(fen)為(wei)兩(liang)(liang)組行線(xian)和列線(xian)，在行列線(xian)的(de)(de)(de)交叉點設置一個按(an)(an)(an)鍵(jian)(jian)(jian)(jian)(jian)，這種(zhong)(zhong)結構可(ke)以使(shi)用(yong)少量(liang)的(de)(de)(de)I/O口(kou)線(xian)組成較多(duo)的(de)(de)(de)按(an)(an)(an)鍵(jian)(jian)(jian)(jian)(jian)，提高單(dan)片機(ji)的(de)(de)(de)I/O利(li)用(yong)率，當按(an)(an)(an)鍵(jian)(jian)(jian)(jian)(jian)較多(duo)時，采用(yong)這種(zhong)(zhong)結構較為(wei)合(he)適。

飛(fei)泰漏(lou)磁檢測系統設計時，采用單片機P5口(kou)的8條I/O口(kou)線，組成一個4×4的矩陣鍵(jian)(jian)(jian)盤(pan)，鍵(jian)(jian)(jian)盤(pan)是由16個按(an)(an)鈕組成的，主(zhu)要是用來發出一些控制指令和設置一些系統參數。其原理(li)是：當沒(mei)有按(an)(an)鍵(jian)(jian)(jian)按(an)(an)下(xia)時，P5.0-P5.3與(yu)P5.4-P5.7之間開(kai)路。當有按(an)(an)鍵(jian)(jian)(jian)按(an)(an)下(xia)時，與(yu)閉合鍵(jian)(jian)(jian)相連的兩個I/O口(kou)線短路。因此，判斷有無按(an)(an)鍵(jian)(jian)(jian)按(an)(an)下(xia)的方(fang)法是：

（1）單(dan)片機將列(lie)(lie)線(xian)(xian)(xian)P5.4-P5.7設置為(wei)輸入狀態，在(zai)行(xing)線(xian)(xian)(xian)P5.0-P5.3上(shang)輸出(chu)低電平，此時單(dan)片機從(cong)列(lie)(lie)線(xian)(xian)(xian)上(shang)讀入數據，若有列(lie)(lie)線(xian)(xian)(xian)為(wei)低電平，則表示該列(lie)(lie)線(xian)(xian)(xian)有按(an)(an)鍵按(an)(an)下(xia),從(cong)而確定列(lie)(lie)線(xian)(xian)(xian)。

（2）單片機在行(xing)線(xian)上輪(lun)流輸出低電平，讀入列線(xian)P5.4-P5.7 數據，若(ruo)有(you)列線(xian)為低電平，則表(biao)示(shi)對應行(xing)線(xian)上有(you)按(an)鍵(jian)按(an)下，從而確定行(xing)線(xian)。

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